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HERO ID
1632903
Reference Type
Journal Article
Title
Marangoni wafer drying avoids disadvantages
Author(s)
Wolke, K; Eitel, B; Schenkl, M; Rummelin, S; Schild, R
Year
1996
Is Peer Reviewed?
0
Journal
Solid State Technology
ISSN:
0038-111X
Volume
39
Issue
8
Page Numbers
87
Web of Science Id
WOS:A1996VB24300023
Abstract
A major problem with wet-cleaning equipment in semiconductor wafer fabrication is the final step of the process - drying the wafers. Widely used drying techniques involve either spinning liquid off the wafer (which stresses the wafer) or using an isopropanol rinse and allowing it to evaporate (which may introduce safety and environmental problems). Marangoni technology provides a gentler, safer, and environmentally friendly alternative for wafer drying, compatible with both hydrophilic and hydrophobic wafer surfaces. This article explains the basic principle and process sequence for Marangoni drying, and demonstrates the technology's particle performance, residue-free drying, absence of wafer stress, and low alcohol consumption. Also, applications of the drying technique to 300-mm wafers and future cleaning technologies are discussed.
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