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2639328 
Journal Article 
Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope 
Trimby, PW 
2012 
1 
Ultramicroscopy
ISSN: 0304-3991 
120 
16-24 
22796555 
WOS:000308082600003 
In this study, the new technique of transmission Kikuchi diffraction (TKD) in the scanning electron microscope (SEM) has been applied for the first time to enable orientation mapping of bulk, nanostructured metals. The results show how the improved spatial resolution of SEM-TKD, compared to conventional EBSD, enables reliable mapping of truly nanostructured metals and alloys, with mean grain sizes in the 40-200 nm range. The spatial resolution of the technique is significantly below 10 nm, and contrasting examples are shown from both dense (Ni) and lighter (Al-alloy) materials. Despite the burden of preparing thin, electron-transparent samples, orientation mapping using SEM-TKD is likely to become invaluable for routine characterisation of nanocrystalline and, potentially, highly deformed microstructures. (c) 2012 Elsevier B.V. All rights reserved. 
TKD; EBSD; t-EBSD; Nanomaterials; Ultrafine-grained materials; Spatial resolution