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HERO ID
384851
Reference Type
Journal Article
Title
Electron-beam-induced reduction of Fe(3+) in iron phosphate dihydrate, ferrihydrite, haemosiderin and ferritin as revealed by electron energy-loss spectroscopy
Author(s)
Pan, YH; Vaughan, G; Brydson, R; Bleloch, A; Gass, M; Sader, K; Brown, A
Year
2010
Is Peer Reviewed?
1
Journal
Ultramicroscopy
ISSN:
0304-3991
Language
English
DOI
10.1016/j.ultramic.2010.01.008
Abstract
The effect of high-energy electron irradiation on ferritin/haemosiderin cores (in an iron-overloaded human liver biopsy), its mineral analogue; six-line ferrihydrite (6LFh), and iron phosphate dihydrate (which has similar octahedral ferric iron to oxygen coordination to that in ferrihydrite and ferritin/haemosiderin cores) has been investigated using electron energy-loss spectroscopy (EELS). Fe L(2,3)-ionisation edges were recorded on two types of electron microscope: a 200keV transmission electron microscope (TEM) and a 100keV scanning transmission electron microscope (STEM), in order to investigate the damage mechanisms in operation and to establish a methodology for minimum specimen alteration during analytical electron microscopic characterisation. A specimen damage mechanism dominated by radiolysis that results in the preferential loss of iron co-ordinating ligands (O, OH and H(2)O) is discussed. The net result of irradiation is structural re-organisation and reduction of iron within the iron hydroxides. At sufficiently low electron fluence and particularly in the lower incident energy, finer probe diameter STEM, the alteration is shown to be minimal. All the materials examined exhibit damage which as a function of cumulative fluence is best fitted by an inverse power-law, implying that several chemical and structural changes occur in response to the electron beam and we suggest that these are governed by secondary processes arising from the primary ionisation event. This work affirms that electron fluence and current density should be considered when measuring mixed valence ratios with EELS.
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