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HERO ID
6646262
Reference Type
Journal Article
Title
Phase identification and elastic property of blend copolymer characterized by force modulation microscopy and force-distance curve
Author(s)
Kang, B; Lee, JS; Pham, L; Sung, C; ,
Year
2004
Publisher
NANO SCIENCE & TECHNOLOGY INST
Location
CAMBRIDGE
Book Title
2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
Volume
3
Page Numbers
433-436
Language
English
Web of Science Id
WOS:000223078200114
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-6344243210&partnerID=40&md5=1b8555f3a7609c666c1645050dcf139a
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Abstract
The technique of polymer blending has been used to create new types of polymers with desirable properties in the past decade. Force Modulation Microscopy (FMM) provides a local contrast due to the local elasticity difference of a sample surface in addition to topography information [1]. The mechanical properties are examined continuously over the extended area and force modulation mode is utilized to identify two phases to measure local elastic properties [2]. Poly(styrene-isobutylene-styrene) (SIBS) blended with poly(styrene-maleic anhydride) (SMA) was characterized by Atomic Force Microscopy (AFM) to understand phase identification. Young's moduli of bulk materials were obtained by tensile testing machine from the slope of stress-strain curve [3]. The localized elastic modulus of each phase is obtained by F-D curve through adopting the mathematical theory [4] and image analysis was employed to measure the volume fraction from FMM images at different blending ratios.
Keywords
Elastic Modulus; Force Modulation Microscopy (FMM); Phase Identification; Polymer blends
Editor(s)
Laudon, M; Romanowicz, B;
ISBN
0-9728422-9-2
Conference Name
Nanotechnology Conference and Trade Show (Nanotech 2004)
Conference Location
Boston, MA
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