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HERO ID
7146911
Reference Type
Journal Article
Title
Ferroelectric random access memory (FRAM) devices
Author(s)
Eshita, T; Tamura, T; Arimoto, Y; ,
Year
2014
Publisher
WOODHEAD PUBL LTD
Location
CAMBRIDGE
Book Title
ADVANCES IN NON-VOLATILE MEMORY AND STORAGE TECHNOLOGY
Page Numbers
434-454
DOI
10.1533/9780857098092.3.434
Web of Science Id
WOS:000341433200014
Abstract
We review the history of, and recent advances in, ferroelectric memory, including ferroelectric random access memory (FRAM or FeRAM). FRAM is the first among advanced non-volatile memories, such as magnetoresistive random-access memory (MRAM), phase-change random access memory (PRAM) and resistive random access memory (ReRAM), to be commercialized. Highly reliable FRAM with a memory density of a few Mb is currently available. Since FRAM has excellent electric properties, such as a high speed read/write (<50 ns), high switching endurance (>= 10(13)) and low power consumption, it has been applied to radio frequency identification (RFID) tags, advanced smartcards and so on. We also describe newly developed materials, fabrication processes and circuit technology, which are expected to overcome the scalability problem of FRAM.
Editor(s)
Nishi, Y;
ISBN
978-0-85709-803-0
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