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7627495 
Journal Article 
X-ray diffraction study of anthracene under high pressure 
Oehzelt, M; Resel, R; Hummer, K; Puschnig, P; Ambrosch-Draxl, C; Nakayama, A; , 
2003 
1 
Synthetic Metals
ISSN: 0379-6779 
ELSEVIER SCIENCE SA 
LAUSANNE 
137 
1-3 
913-914 
English 
WOS:000182533900026 
The aim of this study is to investigate the structural changes of molecular crystals based on aromatic molecules under high pressure. For this purpose we carried out angle dispersive X-ray diffraction experiments under pressure up to 25 GPa in combination with Rietveld refinement methods. Furthermore density functional calculations based on the experimentally obtained lattice parameters were carried out. We discuss the structural change of anthracene as a function of pressure and find very good agreement between experiment and theory. 
Anthracene; High pressure; Organic semiconductors; Rietveld refinement; Structural changes under high pressure; X-ray diffraction 
Zhu D.B. 
International Conference on Science and Technology of Synthetic Metals (ICSM 2002) 
SHANGHAI, PEOPLES R CHINA