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7763022 
Journal Article 
Dielectric constants of C-60 and C-70 thin films 
Kataura, H; Endo, Y; Achiba, Y; Kikuchi, K; Hanyu, T; Yamaguchi, S 
1997 
Yes 
Journal of Physics and Chemistry of Solids
ISSN: 0022-3697
EISSN: 1879-2553 
Elsevier Ltd 
58 
11 
1913-1917 
English 
WOS:000071510100047 
Transmittance and reflectance spectra of C60 and C70 thin films have been measured at room temperature from 1.5 to 6.0 eV for 45° incidence with s-polarized light. The most reliable dielectric constants are obtained by fitting the observed optical values to the calculated ones using a strict solution of Maxwell equations. The imaginary part of the molecular polarizability spectrum was converted from the dielectric constants using Clausius-Mossotti's formula. For C60, the spectrum shows good correspondence, in peak positions and intensities to that of solution in hexane, except for the structure from 2.3 to 3.0 eV due to the intrinsic solid state effect. The same correspondence is also observed in C70, but no apparent solid state effect is observed. © 1997 Elsevier Science Ltd. 
fullerenes; thin films; vapour deposition; optical properties