US EPA

3797781 

Technical Report 

Contribution de l'analyse RBS a l'etude des effets d'irradiation sur la diffusion dans les verres d'oxydes. (Contribution of Rutherford backscattering spectrometry to the study of irradiation effects on diffusion properties in oxides glasses) 

Calmon, P 

1990 

NTIS/02981894 

GRA and I 

GRA and I 

We have studied the impurity diffusion of heavy elements (lead, uranium) in soda lime silicate glasses under irradiation with ions (He(sup +) 1000 KeV,Ar(sup +) 250-500 KeV), with gamma rays (1.17-1.33 MeV) and with X-rays (40-60 KeV). RF sputtering and ionic implantation methods have been used for the diffusion target preparation. A comparison of these technics reveals ionic implantation as the most suitable method. For the analysis of profiles the backscattering spectrometry has been used. RBS simulation programs have been developed in order to treat some complex situations like lateral inhomogeneities and composition changes of the sample. Enhanced diffusion and occasionally precipitation have been observed under ions irradiation for lead, while uranium was more diffusing under gamma rays irradiations. On the contrary no X-rays effect have been noted. Our results show that network modifiers impurities diffusion (in our case lead) are generally controlled by sodium redistributions. The radiation damages are not negligible and electronic excitations play a dominant role. (ERA citation 16:023524)