Nanoscale crystal grain characterization via linear polarization X-ray ptychography | Health & Environmental Research Online (HERO)

Health & Environmental Research Online (HERO)

Print Feedback Export to File

This record has one attached file:

Citation
Tags

HERO ID

7767937

Reference Type

Journal Article

Title

Nanoscale crystal grain characterization via linear polarization X-ray ptychography

Author(s)

Gao, Z; Holler, M; Odstrcil, M; Menzel, A; Guizar-Sicairos, M; Ihli, J

Year

2020

Is Peer Reviewed?

Yes

Journal

Chemical Communications
ISSN: 1359-7345
EISSN: 1364-548X

Volume

Issue

Page Numbers

13373-13376

Language

English

PMID

33030473

DOI

10.1039/d0cc06101h

Web of Science Id

WOS:000584203400015

Abstract

X-ray linear dichroism and X-ray birefringence microscopy are yet to be fully utilized as instruments in the microstructural characterization of crystalline materials. Here, we demonstrate analyser-free X-ray linear dichroism microscopy using spectroscopic hard X-ray ptychography. First experiments enabled a spectroscopic and microstructural characterisation of polycrystalline vanadium pentoxide on the nanoscale, outside of diffraction-contrast based methods.