Jump to main content
US EPA
United States Environmental Protection Agency
Search
Search
Main menu
Environmental Topics
Laws & Regulations
About EPA
Health & Environmental Research Online (HERO)
Contact Us
Print
Feedback
Export to File
Search:
This record has one attached file:
Add More Files
Attach File(s):
Display Name for File*:
Save
Citation
Tags
HERO ID
2151422
Reference Type
Book/Book Chapter
Title
Thermal efficient three dimensional semiconductor packages for high performance processor modules
Author(s)
Ahearn, W
Year
1998
Publisher
IMAPS
Location
Berlin, Reston, VA
Book Title
1998 International Symposium on Microelectronics
Volume
3582
Page Numbers
726-731
Language
English
Web of Science Id
WOS:000078815800123
Abstract
A new family of semiconductor packages, referred to as VSPA (TM), is described that combines unique 3D design features and materials technology selection to produce superior electrical, thermal and mechanical performance for both single and multiple chip modules. These packages are readily scaleable to accommodate a wide variety of footprint, shape, I/O (up to 1000) and bandwidth requirements at very low cost ($.01). The unique design and fabrication method eliminates the die leadframe allowing a smaller footprint, relaxed lead pitch, and robust leads with improved coplanarity. The I/O pins are a constant regardless of the package frame size which provides a low inductance path from the die to the PCB. The peripheral lead structure allows for visual inspection and ease of rework. The die attaches in a flip chip manner to a metallic plate, an integral part of the package, providing a direct thermal path to ambient or cooling devices.
The 3D stacking of the leads results in significant size reduction, low inductance paths, with the pin design providing reduced package parasitics allowing resonance free operation up to 3.5 GHz. Techniques for the 3D stacking of chips are described as well as environmental test results, standard activity, and novel headsink designs. A liquid crystal polymer frame provides excellent stability with a 335 degrees C melt point, allows for tolerances of less than I mil to be held for pin alignment and coplanarity in high volume manufacturing environments.
Series
Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)
ISBN
0930815521
Conference Name
1998 International Symposium on Microelectronics
Conference Location
San Diego, CA
Conference Dates
November 01-04, 1998
Tags
IRIS
•
PCBs
Litsearches
Initial Filter
Non Peer-Reviewed
LitSearch August 2015
WoS
Home
Learn about HERO
Using HERO
Search HERO
Projects in HERO
Risk Assessment
Transparency & Integrity