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2160414 
Journal Article 
Reliability of low-cost PCB interconnections for telecommunication applications 
Duchamp, G; Verdier, F; Deshayes, Y; Marc, F; Ousten, Y; Danto, Y 
2004 
Microelectronics Reliability
ISSN: 0026-2714 
44 
9-11 
1299-1304 
Today the low cost PCB interconnections are widely used for domestic telecommunication applications. These technologies are limited by the possible variation of the performances of substrates and metallization during operating life. The knowledge of the behaviour of these parameters under stress conditions allows to optimise the design safety margins and to predict a probable lifetime. In this paper we show that the proposed structures (rings and stub resonators) could be used to discriminate the degradation sources. (C) 2004 Elsevier Ltd. All rights reserved. 
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