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HERO ID
2160414
Reference Type
Journal Article
Title
Reliability of low-cost PCB interconnections for telecommunication applications
Author(s)
Duchamp, G; Verdier, F; Deshayes, Y; Marc, F; Ousten, Y; Danto, Y
Year
2004
Is Peer Reviewed?
1
Journal
Microelectronics Reliability
ISSN:
0026-2714
Volume
44
Issue
9-11
Page Numbers
1299-1304
DOI
10.1016/j.microrel.2004.07.013
Web of Science Id
WOS:000224280000005
Abstract
Today the low cost PCB interconnections are widely used for domestic telecommunication applications. These technologies are limited by the possible variation of the performances of substrates and metallization during operating life. The knowledge of the behaviour of these parameters under stress conditions allows to optimise the design safety margins and to predict a probable lifetime. In this paper we show that the proposed structures (rings and stub resonators) could be used to discriminate the degradation sources. (C) 2004 Elsevier Ltd. All rights reserved.
Tags
IRIS
•
PCBs
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WoS
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Non Peer-Reviewed
LitSearch August 2015
WoS
2017 Restored References_Dec 2023
Restored references_April 2024
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