Jump to main content
US EPA
United States Environmental Protection Agency
Search
Search
Main menu
Environmental Topics
Laws & Regulations
About EPA
Health & Environmental Research Online (HERO)
Contact Us
Print
Feedback
Export to File
Search:
This record has one attached file:
Add More Files
Attach File(s):
Display Name for File*:
Save
Citation
Tags
HERO ID
2173139
Reference Type
Journal Article
Title
Analysis on Thermal Reliability of Key Electronic Components on PCB
Author(s)
Li, X; Xu, S
Year
2012
Volume
15
Issue
12B
Page Numbers
5719-5724
Web of Science Id
WOS:000313149000023
Abstract
Electronic equipments develop continuously toward light, thin, small miniaturization trend. With the increased integration of electronic components and high heat density, small size, compact layout, it leads to high temperature of electronic components which greatly reduce the service life of components and cause job insecurity, failure of components and poor system reliability. Therefore, the thermal design becomes increasingly important. In this paper, the cooling of print circuit board (PCB) as well as several major electronic components is studied as the research object with their thermal reliability based upon heat transfer and fluid dynamics. The layout optimization problem of components on PCB is studied. The corresponding FEM model is established so that the temperature field of the main cooling electronic components on the PCB is solved through the analysis software-ANSYS which displays the high temperature and low temperature areas of PCB. Through realizing the layout optimization of the main cooling electronic components on the PCB and calculating temperature field of the PCB for different layout examples, the rational layout is obtained by comparing the results. This method does not change the condition of external cooling but reduce the maximum working temperature of PCB, improve the reliability of the system and provide a reference for thermal reliability designing of electronic products.
Keywords
Print circuit board; Temperature field; FEM; Optimal design; Reliability
Tags
IRIS
•
PCBs
Litsearches
Remaining
LitSearch August 2015
WoS
Home
Learn about HERO
Using HERO
Search HERO
Projects in HERO
Risk Assessment
Transparency & Integrity