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2173419 
Journal Article 
Research on Nano-ampere Current-measuring Meter System 
Lin Wei; Deng Shao-ai 
2009 
41-44 
WOS:000290244100011 
Nano-level current-measuring device is important for the scanning tunneling microscope. The nano-ampere current measuring meter system based on high-precision amplifiers is mainly designed as two-stage amplifiers structure. Some removing interference ways of hardware are introduced in the design and facture of the PCB. In the current-measuring meter system, wavelet transform is adopted to decrease noise. The experiments show that, the measurement results of this device can be obtained to an accuracy of 1 nA, and the device can reduce some noise interference. 
Nano-ampere current-measuring; two-stage amplifier; signal denoising with wavelet transform 
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