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198169 
Journal Article 
Semivolatile organic compounds in window films from lower Manhattan after the September 11th World Trade Center attacks 
Butt, CM; Diamond, ML; Truong, J; Ikonomou, MG; Helm, PA; Stern, GA 
2004 
Environmental Science & Technology
ISSN: 0013-936X
EISSN: 1520-5851 
38 
13 
3514 
English 
Surface film samples were collected from the exterior of window surfaces in lower Manhattan, New York City, following the terrorist attack on the World Trade Center on September 11, 2001, and contamination by polybrominated diphenyls, PCBs, polychlorinated naphthalenes, PAHs, and organochlorine pesticides was examined. The samples were collected between October 27 and 29 from windows located on either the ground floor or second floor. The contaminant profiles in films near the World Trade Center were found to be unique from background samples, showing evidence of combustion sources. Films from sites near the World Trade Center exhibited enrichment in polychlorinated naphthalenes and PCB compounds. The polybrominated diphenyl ether congener profiles were similar among all sites and were dominated by congeners comprising commercial penta-, octa-, and deca-brominated diphenyl ether mixtures, while PCB congener profiles were, in most cases, dominated by congeners predominant in commercial Aroclor mixtures. The presence of organochlorine pesticides was attributed to long-range transport. The spatial trends in toxic equivalent values followed those of polychlorinated naphthalene and coplanar PCB window film concentrations.ID - 16 
Article Subject Terms: NEW YORK CITY; ATMOSPHERIC POLLUTANT DEPOSITION; SPATIAL COMPARISONS; FLAME RETARDANTS; POLYCHLORINATED BIPHENYLS; POLYCYCLIC AROMATIC HYDROCARBON; ORGANOCHLORINE PESTICIDES 
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